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Table 4 Average values \(\langle d \rangle \) and standard deviations \(\sigma _d\) extracted for the Al grain size distributions for the different substrates in Fig. 7, using the log-normal distribution function

From: Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy

Substrate

\(\hbox {Al}_{2}\hbox {O}_{3}\)

Si

\(\hbox {Si}_{3}\hbox {N}_{4}\)

\(\hbox {SiO}_{2}\)

\(\hbox {SiO}_{2}\) (cold)

\(\langle d \rangle \) (nm)

92 ± 8

78 ± 8

98 ± 8

85 ± 9

62 ± 4

\(\sigma _d\) (nm)

46 ± 10

40 ± 10

57 ± 11

48 ± 12

34 ± 5