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Table 2 Average values \(\langle d \rangle \) and standard deviations \(\sigma _d\) extracted for the Al grain size distributions for the 15 and 60 nm-thick films in Fig. 4, using the log-normal distribution function

From: Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy

Thickness

60 nm

15 nm

\(\langle d \rangle \) (nm)

92 ± 8

38 ± 3

\(\sigma _d\) (nm)

45 ± 10

18 ± 4