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Fig. 5 | SpringerPlus

Fig. 5

From: Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy

Fig. 5

a This plan-view BF TEM image shows a grain with abnormal size in a single 60 nm-thick Al film. The largest dimension of this grain is \(d = 357\,\)nm, as indicated by the dashed white double arrow. This size is about six times the film thickness. b BF TEM image from another area of the plan view sample showing one Al grain with a twin. The arrows indicate the two corresponding twin planes

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