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Fig. 2 | SpringerPlus

Fig. 2

From: Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy

Fig. 2

a SEM image showing surface morphology of the top Al layers top-view. b BF TEM image of the junction, the solid black arrows indicate the Al grains in the two Al layers. The wavy surface on the top Al layer gives rise to the granular contrast observed in SEM as in a. It should be noted that the dimension of the surface roughness observed in TEM matches the dimension of the granular structure in the SEM images. This is indicated by the dashed black lines

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