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Fig. 1

From: Correlation between Al grain size, grain boundary grooves and local variations in oxide barrier thickness of Al/AlOx/Al tunnel junctions by transmission electron microscopy

Fig. 1

a Bright field TEM image of a junction showing the columnar grains in the bottom and top Al layers of the junction. The polycrystalline nature of these layers is obvious from the diffraction contrast of the image. b Plan-view bright field TEM image of a 60 nm-thick Al layer. c Diffraction pattern of the layer in (b). The polycrystalline nature of the Al layer gives rise to the series of concentric rings

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