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Table 2 Thicknesses d of a homogeneous DiMethoxyethyl-PTCDI film below the surface roughness and the corresponding roughness layer heights d r determined for a film with the use of different roughness profiles

From: Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry

Roughness profile of

d/nm

dr/nm

DiMethoxyethyl-PTCDI (AFM)

0

107.6 ± 0.3

DiPhenyl-PTCDI (AFM)

0

104.2 ± 0.3

Proposed model with σ = 13.5%

0

94.8 ± 0.3

50:50 model

27 ± 76

39 ± 70