From: Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry
Roughness profile of
d/nm
dr/nm
DiMethoxyethyl-PTCDI (AFM)
0
107.6 ± 0.3
DiPhenyl-PTCDI (AFM)
104.2 ± 0.3
Proposed model with σ = 13.5%
94.8 ± 0.3
50:50 model
27 ± 76
39 ± 70