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Table 1 Boltzmann equation parameters determined by fitting the AFM derived material/void ratios

From: Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry

 

A/ %

B/ %

C/ %

D/ %

DiMethoxyethyl-PTCDI

-1.5

100.3

46.6

9.7

DiPhenyl-PTCDI

-2.8

99.7

44.0

9.3