Figure 6From: Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometryDielectric functions determined for a DiMethoxyethyl-PTCDI rough thin film using different roughness profiles. Dotted curve: dielectric function determined using the conventional 50:50 EMA model. Orange line: dielectric function determined using the actual AFM profile of the film (parameters in Table 1). Other lines: dielectric functions for the same DiMethoxyethyl-PTCDI film, but using the AFM roughness profiles of completely different films. The AFM derived roughness profiles yield almost identical results independent of their manifold origin, whereas the common 50:50 model overestimates the dielectric function.Back to article page