Figure 2From: Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometryAFM measured topographies. (a) Height profile of DiMethoxyethyl-PTCDI: grayscale from 0 nm (black) to 58 nm (white), (b) height profile of DiPhenyl-PTCDI for comparison: grayscale from 0 nm (black) to 94 nm (white). The roughness parameter, i.e. the material/void function, is deduced by integrating over a grayscale histogram of each AFM picture.Back to article page