Figure 4From: A review on electronic and optical properties of silicon nanowire and its different growth techniques Value of absorption on samples with a-Si:H thin film, NW arrays and NC arrays (a) Measured, (b) Calculated over a large range of wavelengths at normal incidence; (c) Measured (d) Simulated for different angle of incidence (at wavelength λ = 488 nm) (Zhu et al. 2009 ). Back to article page