Figure 1

SEM and STM Analyses of e-beam evaporated Cu thin films as deposited. (a) SEM image of the polycrystalline structure of the Cu surface after e-beam evaporation; (b) STM topographic image of a small portion -∼ 10⁻²μ m²- of the Cu surface; (c) topographic profiles along two directions (red: horizontal, green: vertical) obtained with STM analysis.